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BookmarkThe scanning electron microscope (SEM) is a type of electron microscope capable of producing high resolution images of a sample surface.
Due to the manner in which the image is created, SEM images have a characteristic three-dimensional appearance and are useful for judging the surface structure of the sample..
For more information about the topic Scanning electron microscope, read the full article at Wikipedia.org, or see the following related articles:
Electron microscope — The electron microscope is a type of microscope that uses electrons to create an image of the target. It has much higher magnification or resolving ... > read more
Confocal laser scanning microscopy — Confocal laser scanning microscopy (CLSM or LSCM) is a valuable tool for obtaining high resolution images and 3-D reconstructions. The key feature of ... > read more
Scanning tunneling microscope — The scanning tunneling microscope or STM, was invented in 1981 by Gerd Binnig and Heinrich Rohrer of IBM's Zurich Lab in Zurich, Switzerland. t is ... > read more
Electrical conduction — Electrical conduction is the movement of electrically charged particles through a transmission medium. The movement can form an electric current in ... > read moreNote: This page refers to an article that is licensed under the GNU Free Documentation License. It uses material from the article Scanning electron microscope at Wikipedia.org. See the Wikipedia copyright page for more details.
