The scanning electron microscope (SEM) is a type of electron microscope capable of producing high resolution images of a sample surface.
Due to the manner in which the image is created, SEM images have a characteristic three-dimensional appearance and are useful for judging the surface structure of the sample.
For more information about the topic Scanning electron microscope, read the full article at Wikipedia.org, or see the following related articles:
Editor's Note: This article is not intended to provide medical advice, diagnosis or treatment.
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