The scanning electron microscope (SEM) is a type of electron microscope capable of producing high resolution images of a sample surface.
Due to the manner in which the image is created, SEM images have a characteristic three-dimensional appearance and are useful for judging the surface structure of the sample.
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Note: This page refers to an article that is licensed under the GNU Free Documentation License. It uses material from the article Scanning electron microscope at Wikipedia.org. See the Wikipedia copyright page for more details. Editor's Note: This article is not intended to provide medical advice, diagnosis or treatment.
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