Reference Terms
from Wikipedia, the free encyclopedia

Scanning electron microscope

The scanning electron microscope (SEM) is a type of electron microscope capable of producing high resolution images of a sample surface.

Due to the manner in which the image is created, SEM images have a characteristic three-dimensional appearance and are useful for judging the surface structure of the sample.

Note:   The above text is excerpted from the Wikipedia article "Scanning electron microscope", which has been released under the GNU Free Documentation License.
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Matter & Energy News
October 9, 2015

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updated 12:56 pm ET