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Reference Terms
from Wikipedia, the free encyclopedia

Scanning tunneling microscope

The scanning tunneling microscope or STM, was invented in 1981 by Gerd Binnig and Heinrich Rohrer of IBM's Zurich Lab in Zurich, Switzerland. t is used to obtain images of conductive surfaces at an atomic scale 2 x 10-10 m or 0.2 nanometre.

Note:   The above text is excerpted from the Wikipedia article "Scanning tunneling microscope", which has been released under the GNU Free Documentation License.
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